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EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 1 features read access time : -90ns, -120ns, -150ns, -200ns single +3.3v power supply -regulated power supply 3.0v - 3.6v (EN27LV512) -unregulated power supply 2.7v - 3.6 v (EN27LV512b for battery operated systems) programming voltage +12.75v quikrite tm programming algorithm typical programming time 20 m s low power cmos operation 1 m a standby (typical) 15ma operation (max.) cmos- and ttl-compatible i/o high-reliability cmos technology latch-up immunity to 100ma from -1v to v cc + 1v two-line control ( oe & ce ) standard product identification code jedec standard pinout 28-pin pdip 32-pin plcc 28-pin tsop (type 1) commercial and industrial temperature ranges general description the EN27LV512 / EN27LV512b is a low voltage, low-power 512k bit, 3.3v one-time- programmable (otp) read-only memory (eprom). organized into 64k words with 8 bits per word, it features quikrite tm single-address location programming, typically at 20 m s per byte. any byte can be accessed in less than 90ns. the EN27LV512 / EN27LV512b has separate output enable ( oe ) and chip enable ( ce ) controls which eliminate bus contention issues. the EN27LV512 has a vcc tolerance range of 3.0v to 3.6v, making it suitable for use in systems that have regulated power supplies. the EN27LV512b has a vcc tolerance range of 2.7v to 3.6v, making it ideally suited for battery operated systems. figure 1. pdip pin name function a0-a15 addresses dq0-dq7 outputs ce chip enable oe output enable nc no connect EN27LV512 / EN27LV512b 512kbit eprom (64k x 8)
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 2 figure 2. tsop EN27LV512 / EN27LV512b figure 3. plcc top view
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 3 figure 4. block diagram functional description the quikrite tm programming of the EN27LV512 / EN27LV512b when the EN27LV512 / EN27LV512b is delivered, the chip has all 512k bits in the one, or high state. zeros are loaded into the EN27LV512 / EN27LV512b through the procedure of programming. the programming mode is entered when 12.75 0.25v is applied to the oe /v pp pin and ce is at v il . for programming, the data to be programmed is applied with 8 bits in parallel to the data pins. the quikrite tm programming flowchart in figure 5 shows eons interactive programming algorithm. the interactive algorithm reduces programming time by using 20 m s to 100 m s programming pulses and giving each address only as many pulses as is necessary in order to reliably program the data. after each pulse is applied to a given address, the data in that address is verified. if the data is not verified, additional pulses are given until it is verified or until the maximum number of pulses is reached. this process is repeated while sequencing through each address of the EN27LV512 / EN27LV512b. this part of the programming algorithm is done at v cc = 6.25v to assure that each eprom bit is programmed to a sufficiently high threshold voltage. this ensures that all bits have sufficient margin. after the final address is completed, the entire eprom memory is read at v cc = 5.25 0.25v to verify the entire memory. EN27LV512 / EN27LV512b can be programmed using the same programming algorithm as the 5v read eprom en27c512.
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 4 program inhibit mode programming of multiple EN27LV512 / EN27LV512b in parallel with different data is also easily accomplished by using the program inhibit mode. except for ce , all like inputs of the parallel EN27LV512 / EN27LV512b may be common. a ttl low-level program pulse applied to an EN27LV512 / EN27LV512b ce input with oe /v pp = 12.75 0.25v will program that EN27LV512 / EN27LV512b. a high-level ce input inhibits the other EN27LV512 / EN27LV512b from being programmed. program verify mode verification should be performed on the programmed bits to determining that they were correctly programmed. the verification should be performed with oe /v pp and ce at v il . data should be verified at t dv after the falling edge of ce . auto product identification the auto product identification mode allows the reading out of a binary code from an eprom that will identify its manufacturer and type. this mode is intended for use by programming equipment for the purpose of automatically matching the device to be programmed with its corresponding programming algorithm. this mode is functional in the 25 c 5 c ambient temperature range that is required when programming the EN27LV512 / EN27LV512b. to activate this mode, the programming equipment must force 12.0 v 0.5v on address line a9 of the EN27LV512 / EN27LV512b. two identifier bytes may then be sequenced from the device outputs by toggling address line a0 from v il to v ih , when a1 = v ih . all other address lines must be held at v il during auto product identification mode. byte 0 (a0 = v il ) represents the manufacturer code, and byte 1 (a0 = v ih ), the device code. for the EN27LV512 / EN27LV512b, these two identifiers bytes are given in the mode select table. all identifiers for manufacturer and device codes will possess odd parity, with the msb (dq7) defined as the parity bit. when a1 = v il , the EN27LV512 / EN27LV512b will read out the binary code of 7f, continuation code, to signify the unavailability of manufacturer id codes.
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 5 read mode the EN27LV512 / EN27LV512b has two control functions, both of which must be logically satisfied in order to obtain data at the outputs. chip enable ( ce ) is the power control and should be used for device selection. output enable ( oe ) is the output control and should be used to gate data to the output pins, independent of device selection. assuming that addresses are stable, address access time (t acc ) is equal to the delay from ce to output (t ce ). data is available at the outputs (t oe ) after the falling edge of oe , assuming the ce has been low and addresses have been stable for at least t acc - t oe . standby mode the EN27LV512 / EN27LV512b has cmos standby mode which reduces the maximum v cc current to 10 m a. it is placed in cmos standby when ce is at v cc 0.3 v. the EN27LV512 / EN27LV512b also has a ttl-standby mode which reduces the maximum v cc current to 0.6 ma. it is placed in ttl-standby when ce is at v ih . when in standby mode, the outputs are in a high-impedance state, independent of the oe input. two-line output control function to accommodate multiple memory connections, a two-line control function is provided to allow for: 1. low memory power dissipation, 2. assurance that output bus contention will not occur. it is recommended that ce be decoded and used as the primary device-selection function, while oe be made a common connection to all devices in the array and connected to the read line from the system control bus. this assures that all deselected memory devices are in their low-power standby mode and that the output pins are only active when data is desired from a particular memory device. system considerations during the switch between active and standby conditions, transient current peaks are produced on the rising and falling edges of chip enable. the magnitude of these transient current peaks is dependent on the output capacitance loading of the device. at a minimum, a 0.1 m f ceramic capacitor (high frequency, low inherent inductance) should be used on each device between vcc and vss to minimize transient effects. in addition, to overcome the voltage drop caused by the inductive effects of the printed circuit board traces on eprom arrays, a 4.7 m f bulk electrolytic capacitor should be used between vcc and vss for each eight devices. the location of the capacitor should be close to where the power supply is connected to the array.
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 6 mode select tab mode ce oe / v pp a0 a9 out p ut read v il v il xxd out output disable v il v ih x x high z standby (ttl) v ih x x x high z standby (cmos) v cc 0.3v x x x high z program (4) v il v pp xxd in program verify v il v il xxd out program inhibit v ih v p p x x high z manufacturer code (3) v il v il v il vh(1) 1c device code (3) v il v il v ih vh (1) 83 notes: 1) vh = 12.0v 0.5v 2) x = either v ih or v il 3) for manufacturer code and device code, a1 = v ih when a1 = v il , both codes will read 7f 4) see dc programming characteristics for v pp voltage during programming eon's standard product identification code pins hex data code a0 a1 dq7 dq6 dq5 dq4 dq3 dq2 dq1 dq0 manufacturer 010001110 01c device type 111000001 1 83 continuation 000111111 17f 100111111 17f
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 7 figure 5. quikrite tm programming flow chart note 1: either 100 m s or 20 m s pulse. note 1
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 8 absolute maximum ratings storage temperature -65 c to +125 c ambient temperature with power applied -40 c to +85 c voltage with respect to v ss all pins except a9, v pp , v cc -0.6v to v cc + 0.5v a9, v pp -0.6v to +13.5v v cc -0.6v to +7.0v operating ranges commercial (c) case temperature(tc) 0 c to +70 c industrial (i) case temperature(tc) -40 c to +85 c supply read voltages (for battery operated systems) +3.0v to +3.6v +2.7v to +3.6v (functionality is guaranteed between these limits) stresses above those shown above may cause permanent damage to the device. this is a stress rating only and operation above these specifications for extended periods may affect device reliability. operation outside the "operating ranges" shown above voids any and all warranty provisions. dc characteristics for read operation symbol parameter min. max. unit conditions v oh output high voltage 2.4 v i oh = -2.0ma v ol output low voltage 0.45 v i ol = 2.0ma v ih input high voltage 2.0 v cc +0.5 v v il input low voltage -0.3 0.8 v i li input leakage current -5 5 m a v in = 0 to 3.6v i lo output leakage current -10 10 m a v out = 0 to 3.6v i cc3 v cc power -down current 10 m a ce = v cc 0.3v i cc2 v cc standby current 0.6 ma ce = v ih i cc1 v cc active current 15 ma ce = v il , f=5mhz, i out = 0ma i pp1 v pp supply current read 100 m a ce = oe = v il , v pp = 3.6v capacitance symbol parameter typ. max. unit conditions c in input capacitance 8 12 pf v in = 0v c out output capacitance 8 12 pf v out = 0v c vpp v pp capacitance 18 25 pf v pp = 0v
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 9 ac characteristics for read operation EN27LV512 EN27LV512b -90 -120 -120 -150 -150 -200 -200 symbol parameter condition min max min max min max min max unit tacc (3) address to output delay ce = oe = v il 90 120 150 200 ns tce (2) ce to output delay oe = v il 90 120 150 200 ns toe (2, 3) oe to output delay oe = v il 45 45 50 50 ns tdf (4, 5) oe or ce high to output float, whichever occurred first 40 40 40 40 ns toh output hold from address, ce or oe , whichever occurred first 0000 ns figure 6. ac waveforms for read operation ce address address valid oe output output valid tce tacc high z toe tdf toh
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 10 figure 7. test waveforms and measurements in p ut test waveform and measurement output test load dc programming characteristics test limits symbol parameter conditions min. max units i li input load current v in = v il , v ih 5.0 m a v il input low level -0.5 0.8 v v ih input high level 0.7 v cc v cc + 0.5 v v ol output low voltage i ol = 2.0 ma 0.45 v v oh output high voltage i oh = -400 m a 2.4 v i ccp v cc supply current 40 ma i pp2 v pp supply current ce = v il, 10 ma v id a9 product identification voltage 11.5 12.5 v v cc quikrite supply voltage 6.0 6.5 v v pp quikrite programming voltage 12.5 13.0 v
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 11 figure 8. programming waveforms
EN27LV512 / EN27LV512b 4800 great america parkway ste 202 tel: 408-235-8680 santa clara, ca. 95054 fax: 408-235-8685 preliminary 12 switching programming characteristics (t a = + 25 c 5 c) parameter symbol standard parameter description min. max units t as address setup time 2 m s t oes oe /v pp setup time 2 m s t oeh oe /v pp hold time 2 m s t ds data setup time 2 m s t ah address hold time 0 m s t dh data hold time 2 m s t dfp output enable to output float delay 0 130 ns t pw pgm program pulse width 20 105 m s t vcs v cc setup time 2 m s t dv data valid from ce 150 ns t vr oe /v pp hold time 2 m s ordering information EN27LV512 90 p i temperature range (blank) = commercial ( 0 c to +70 c) i = industrial ( -40 c to +85 c) package p = 28 plastic dip j = 32 plastic plcc t = 28 plastic tsop speed 90 = 90ns 120 = 120ns 150 = 150ns 200 = 200ns base part number en = eon silicon devices 27 = eprom lv = low voltage cmos 512 = 64k x 8 3.0v to 3.6v vcc tolerance 512b = 64k x 8 2.7v to 3.6v vcc tolerance

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